Method IO-3.6

Determination of Metals in Ambient Particulate Matter Using Proton Induced X-Ray Emission (PIXE) Spectroscopy


This method is from EPA's Inorganic Compendium of methods and is for the determination of metals from ambient air sources using proton induced x-ray emission spectroscopy (PIXE).

The filter used for collection should have the thinnest possible backing materials made exclusively from low atomic number elements such as carbon, hydrogen, oxygen, and nitrogen.  The thickness shouldn't exceed 1000ug/cm2 to keep the background low and provide the best detection limits in the analysis.  A polycarbonate track etched (PCTE) filter or Teflon® or Kepton® impaction surface is recommended for sampling.

Samples are collected using a dichotomous sampler following the procedures in Compendium Method IO-2.2 or a Partisol® sampler following the procedures in Compendium Method IO-2.3.  Both samplers are able to separate fine and coarse particles.  Fine particles are defined those with aerodynamic diameters from 0-2.5um.  Coarse particles are defined as those with aerodynamic diameters of 2.5-10.0um.  The collection methods specify a low-flow collection rate of 16.7L/min. 

Once the sample is collected, it placed in it's specially designed filter hold to minimize particle loss and sealed in a plastic bag.  The sample is then analyzed using PIXE.


(EPA 625/R-96/010A)

Request-A-Quote

No Obligation Quotation for Analytical Services

If you would like us to provide a quote for laboratory analysis, just provide us with as much information as you can about your project (the more, the better) and we'll provide you a quote via email. As you are searching or browsing our Analytical Guide, you'll see the Request-A-Quote icon... just click on it to start the request process.
Request-A-Quote

Method Data

Hold Times, Preservatives, Preps, Collection, Analytical & Documentation
Holding Time:   None specified in method.
Preservatives:   None specified in method.
Required Preps:   PCTE filter or Teflon/Kepton impaction surface
Collection Method:   Dichotomous sampler following Compendium Method IO-2.2 procedures.
Analytical Methodology:   PIXE
Documentation:   IO-3.6

Analyte List*

Analyte Formula CAS Number Detection Limit
Tellurium
Te
13494-80-9
31
 ng/m3
Aluminum
Al
7429-90-5
16.3
 ng/m3
Dysprosium
Dy
7429-91-6
9.63
 ng/m3
Iridium
Ir
7439-88-5
12.3
 ng/m3
Iron
Fe
7439-89-6
2.71
 ng/m3
Lanthanum
La
7439-91-0
20.8
 ng/m3
Lead
Pb
7439-92-1
16.9
 ng/m3
Lutetium
Lu
7439-94-3
10.8
 ng/m3
Magnesium
Mg
7439-95-4
18.7
 ng/m3
Manganese
Mn
7439-96-5
3.01
 ng/m3
Mercury
Hg
7439-97-6
14.4
 ng/m3
Molybdenum
Mo
7439-98-7
57.2
 ng/m3
Neodymium
Nd
7440-00-8
15.1
 ng/m3
Nickel
Ni
7440-02-0
2.37
 ng/m3
Niobium
Nb
7440-03-1
43.6
 ng/m3
Osmium
Os
7440-04-2
12.9
 ng/m3
Palladium
Pd
7440-05-3
134
 ng/m3
Platinum
Pt
7440-06-4
13.5
 ng/m3
Potassium
K
7440-09-7
9.93
 ng/m3
Praseodymium
Pr
7440-10-0
16
 ng/m3
Promethium
Pm
7440-12-2
12.6
 ng/m3
Rhenium
Re
7440-15-5
13.2
 ng/m3
Rhodium
Rh
7440-16-6
105
 ng/m3
Rubidium
Rb
7440-17-7
17.8
 ng/m3
Ruthenium
Ru
7440-18-8
89.4
 ng/m3
Samarium
Sm
7440-19-9
12
 ng/m3
Scandium
Sc
7440-20-2
7.82
 ng/m3
Silicon
Si
7440-21-3
14.1
 ng/m3
Silver
Ag
7440-22-4
166
 ng/m3
Sodium
Na
7440-23-5
28.3
 ng/m3
Strontium
Sr
7440-24-6
23.2
 ng/m3
Tantalum
Ta
7440-25-7
10.8
 ng/m3
Technetium
Tc
7440-26-8
73.1
 ng/m3
Terbium
Tb
7440-27-9
9.34
 ng/m3
Thallium
Tl
7440-28-0
16.6
 ng/m3
Thorium
Th
7440-29-1
33.7
 ng/m3
Thulium
Tm
7440-30-4
10.2
 ng/m3
Tin
Sn
7440-31-5
273
 ng/m3
Titanium
Ti
7440-32-6
6.62
 ng/m3
Tungsten
W
7440-33-7
12
 ng/m3
Antimony
Sb
7440-36-0
376
 ng/m3
Arsenic
As
7440-38-2
5.42
 ng/m3
Barium
Ba
7440-39-3
22.6
 ng/m3
Cadmium
Cd
7440-43-9
202
 ng/m3
Cerium
Ce
7440-45-1
18.1
 ng/m3
Cesium
Cs
7440-46-2
25.3
 ng/m3
Chromium
Cr
7440-47-3
3.91
 ng/m3
Cobalt
Co
7440-48-4
2.37
 ng/m3
Copper
Cu
7440-50-8
2.71
 ng/m3
Erbium
Er
7440-52-0
8.73
 ng/m3
Europium
Eu
7440-53-1
10.5
 ng/m3
Gadolinium
Gd
7440-54-2
10.2
 ng/m3
Gallium
Ga
7440-55-3
3.61
 ng/m3
Germanium
Ge
7440-56-4
4.21
 ng/m3
Gold
Au
7440-57-5
14.4
 ng/m3
Hafnium
Hf
7440-58-6
10.5
 ng/m3
Holmium
Ho
7440-60-0
9.34
 ng/m3
Uranium
U
7440-61-1
43.9
 ng/m3
Vanadium
V
7440-62-2
5.42
 ng/m3
Ytterbium
Yb
7440-64-4
10.5
 ng/m3
Yttrium
Y
7440-65-5
29
 ng/m3
Zinc
Zn
7440-66-6
3.61
 ng/m3
Zirconium
Zr
7440-67-7
35.5
 ng/m3
Bismuth
Bi
7440-69-9
16.9
 ng/m3
Calcium
Ca
7440-70-2
8.12
 ng/m3
Indium
In
7440-74-6
240
 ng/m3
Iodine
I2
7553-56-2
29.2
 ng/m3
Sulfur
S
7704-34-9
12.9
 ng/m3
Phosphorus
P
7723-14-0
14.4
 ng/m3
Bromine
Br2
7726-95-6
12.3
 ng/m3
Selenium
Se
7782-49-2
6.32
 ng/m3
Chlorine
Cl2
7782-50-5
12.3
 ng/m3

* The analytes and detection limits listed for each method represent the typical detection limits and analytes reported for that particular method. Keep in mind that analyte lists may vary from laboratory to laboratory. Detection limits may also vary from lab to lab and are dependent upon the sample size, matrix, and any interferences that may be present in the sample.